| Record ID | marc_loc_2016/BooksAll.2016.part21.utf8:185574150:1186 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part21.utf8:185574150:1186?format=raw |
LEADER: 01186cam a2200265 a 4500
001 92006513
003 DLC
005 20070925115920.0
008 920130s1992 enka b 100 0 eng
010 $a 92006513
020 $a0750301880
040 $aDLC$cDLC$dDLC
050 00 $aTK7871.85$b.I5825 1991
082 00 $a621.3815/2/0287$220
111 2 $aInternational Symposium on Defect Recognition and Image Processing in III-V Compounds$n(4th :$d1991 :$cWilmslow, England)
245 10 $aDefect recognition in semiconductors before and after processing :$bproceedings of the fourth International Conference, Wilmslow, UK, 18-22 March, 1991 /$cedited by M.R. Brozel, D.J. Stirland.
260 $aBristol, England ;$aPhiladelphia :$bAdam Hilger,$cc1992.
300 $a310 p. :$bill. (some col.) ;$c31 cm.
504 $aIncludes bibliographical references.
650 0 $aSemiconductors$xDefects$xCongresses.
650 0 $aPhotoluminescence$xCongresses.
650 0 $aGallium arsenide semiconductors$xCongresses.
700 1 $aBrozel, M. R.$q(Michael R.)
700 1 $aStirland, D. J.$q(Derek J.)
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0745/92006513-d.html