| Record ID | marc_loc_2016/BooksAll.2016.part21.utf8:205319614:1068 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part21.utf8:205319614:1068?format=raw |
LEADER: 01068cam a2200277 a 4500
001 92030950
003 DLC
005 19941229112839.0
008 920814s1992 caua b 000 0 eng
010 $a 92030950 //r943
020 $a0818632151 (pbk.)
020 $a081863216X (fiche)
040 $aDLC$cDLC$dDLC
050 00 $aTK7871.99.M44$bB75 1992
082 00 $a621.3815/48$220
245 00 $aBridging faults and IDDQ testing /$c[edited] by Yashwant K. Malaiya and Rochit Rajsuman.
260 $aLos Alamitos, Calif. :$bIEEE Computer Society Press,$cc1992.
300 $avi, 128 p. :$bill. ;$c28 cm.
440 0 $aIEEE Computer Society Press technology series
500 $a"Sponsored by the IEEE Compter Society Technical Committee on Test Technology."
504 $aIncludes bibliographical reference (p. 122-127).
650 0 $aMetal oxide semiconductors, Complementary$xTesting$xData processing.
650 0 $aIddq testing.
700 10 $aMalaiya, Yashwant K.
700 10 $aRajsuman, Rochit.
710 20 $aIEEE Computer Society.$bTest Technology Technical Committee.