| Record ID | marc_loc_2016/BooksAll.2016.part22.utf8:1304967:1071 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part22.utf8:1304967:1071?format=raw |
LEADER: 01071nam a2200253 a 4500
001 92085056
003 DLC
005 19931104143847.8
008 930416s1992 waua b 101 0 eng
010 $a 92085056
020 $a0819409197
040 $aDLC$cDLC
050 00 $aQC443$b.P65 1992
082 00 $a535.52/0287$220
245 00 $aPolarization analysis and measurement :$b19-21 July 1992, San Diego, California /$cDennis H. Goldstein, Russell A. Chipman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash. :$bSPIE,$cc1992.
300 $aix, 413 p. :$bill. ;$c28 cm.
490 1 $aProceedings / SPIE--the International Society of Optical Engineering ;$vv. 1746
504 $aIncludes bibliographical references and index.
650 0 $aPolarimetry$xCongresses.
700 10 $aGoldstein Dennis H.
700 10 $aChipman, Russell A.
710 20 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 1746.