| Record ID | marc_loc_2016/BooksAll.2016.part22.utf8:178456611:770 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part22.utf8:178456611:770?format=raw |
LEADER: 00770cam a2200241 a 4500
001 93037460
003 DLC
005 19950126091505.9
008 930915s1993 paua b 000 0 eng
010 $a 93037460
020 $a0803118562
040 $aDLC$cDLC$dDLC
050 00 $aTJ1075$b.T784 1993
082 00 $a621.8/9$220
245 00 $aTribology :$bwear test selection for design and application /$cA.W. Ruff and Raymond G. Bayer, editors.
260 $aPhiladelphia, PA :$bASTM,$cc1993.
300 $aviii, 178 p. :$bill. ;$c23 cm.
490 1 $aSTP ;$v1199
504 $aIncludes bibliographical references.
650 0 $aTribology.
700 10 $aRuff, Arthur W.
700 10 $aBayer, R. G.$q(Raymond George),$d1935-
830 0 $aASTM special technical publication ;$v1199.