| Record ID | marc_loc_2016/BooksAll.2016.part23.utf8:116924444:1032 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part23.utf8:116924444:1032?format=raw |
LEADER: 01032cam a2200265 a 4500
001 94003081
003 DLC
005 20060718214011.0
008 940126s1994 nyua b 001 0 eng
010 $a 94003081
020 $a019509204X (acid-free paper) :$c$49.95
040 $aDLC$cDLC$dDLC
050 00 $aQH212.S32$bS27 1994
082 00 $a502/.8/2$220
100 1 $aSarid, Dror.
245 10 $aScanning force microscopy :$bwith applications to electric, magnetic, and atomic forces /$cDror Sarid.
250 $aRev. ed.
260 $aNew York :$bOxford University Press,$c1994.
300 $axiii, 263 p. :$bill. ;$c25 cm.
440 0 $aOxford series in optical and imaging sciences ;$v5
504 $aIncludes bibliographical references (p. 233-259) and index.
650 0 $aScanning force microscopy.
650 0 $aSurfaces (Physics)
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0603/94003081-d.html
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/enhancements/fy0603/94003081-t.html