| Record ID | marc_loc_2016/BooksAll.2016.part23.utf8:152249122:1069 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part23.utf8:152249122:1069?format=raw |
LEADER: 01069cam a2200277 a 4500
001 94045877
003 DLC
005 20080311084049.0
008 941216s1995 nyua b 001 0 eng
010 $a 94045877
020 $a0306448580
040 $aDLC$cDLC$dDLC
050 00 $aQC793.5.E622$bX14 1995
082 00 $a543/.08586$220
245 00 $aX-ray spectrometry in electron beam instruments /$cedited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury.
260 $aNew York :$bPlenum Press,$cc1995.
300 $axviii, 372 p. :$bill. ;$c26 cm.
504 $aIncludes bibliographical references and index.
650 0 $aElectron beams$xInstruments.
650 0 $aX-ray spectroscopy.
650 0 $aElectron probe microanalysis.
700 1 $aWilliams, David B.$q(David Bernard),$d1949-
700 1 $aGoldstein, Joseph,$d1939-
700 1 $aNewbury, Dale E.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0820/94045877-d.html
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/enhancements/fy0820/94045877-t.html