| Record ID | marc_loc_2016/BooksAll.2016.part24.utf8:102962585:831 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part24.utf8:102962585:831?format=raw |
LEADER: 00831pam a2200229 a 4500
001 95016763
003 DLC
005 19950912070912.2
008 950407s1995 waua 001 0 eng
010 $a 95016763
020 $a0819419362 (alk. paper)
040 $aDLC$cDLC$dDLC
050 00 $aQC411$b.S44 1955
082 00 $a621.36$220
245 00 $aSelected papers on interference, interferometry, and interferometric metrology /$ceditors, P. Hariharan, Daniel Malacara.
246 3 $aInterference, interferometry, and interferometric metrology
260 $aBellingham, Wash. :$bSPIE Optical Engineering Press,$cc1995.
300 $axv, 701 p. :$bill. ;$c29 cm.
440 0 $aSPIE milestone series ;$vv. MS 110
504 $aIncludes bibliographical references and indexes.
700 1 $aHariharan, P.
700 1 $aMalacara, Daniel,$d1937-