| Record ID | marc_loc_2016/BooksAll.2016.part24.utf8:105205517:784 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part24.utf8:105205517:784?format=raw |
LEADER: 00784cam a2200241 a 4500
001 95019428
003 DLC
005 19960508111556.7
008 950504s1995 nyua b 001 0 eng
010 $a 95019428
020 $a0387945415 (hc : alk. paper)
040 $aDLC$cDLC$dDLC
050 00 $aQC482.D5$bZ48 1995
082 00 $a545/.81$220
100 1 $aZevin, Lev S.
245 10 $aQuantitative X-ray diffractometry /$cLev S. Zevin, Giora Kimmel ; edited by Inez Mureinik.
260 $aNew York :$bSpringer,$cc1995.
300 $axvii, 372 p. :$bill. ;$c25 cm.
504 $aIncludes bibliographical references (p. 355-364) and index.
650 0 $aX-rays$xDiffraction.
650 0 $aX-rays$xDiffraction$xIndustrial applications.
700 1 $aKimmel, Giora.
700 1 $aMureinik, Inez.