| Record ID | marc_loc_2016/BooksAll.2016.part24.utf8:134109796:1411 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part24.utf8:134109796:1411?format=raw |
LEADER: 01411nam a2200325 a 4500
001 95070064
003 DLC
005 19960718141501.9
008 950802s1995 waua b 101 0 eng d
010 $a 95070064
020 $a0819417068 (pbk.)
035 $a(OCoLC)32836722
040 $aAzU$cAzU$dDLC
042 $alccopycat
050 04 $aQC426$b.R44 1995
082 00 $a621.36$220
245 00 $aRefractometry :$b16-20 May 1994, Warsaw, Poland /$cMaksymilian Pluta, Mariusz Szyjer, chairs/editors ; organized by SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland).
260 $aBellingham, Wash., USA :$bSPIE,$cc1995.
300 $axxii, 228 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series ;$vv. 2208
504 $aIncludes bibliographical references and index.
650 0 $aRefraction$xCongresses.
650 0 $aRefraction, Double$xCongresses.
700 1 $aPluta, Maksymilian.
700 1 $aSzyjer, Mariusz.
710 2 $aSociety of Photo-optical Instrumentation Engineers.$bPoland Chapter.
710 2 $aInstitute of Applied Optics (Poland)
710 2 $aSociety of Photo-optical Instrumentation Engineers.
710 2 $aKomitet Badań Naukowych (Poland)
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 2208.