| Record ID | marc_loc_2016/BooksAll.2016.part24.utf8:135103665:1450 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part24.utf8:135103665:1450?format=raw |
LEADER: 01450cam a2200313 a 4500
001 95072260
003 DLC
005 19970728154931.2
008 960508s1996 waua b 101 0 eng d
010 $a 95072260 //r97
020 $a0819420395
035 $a(OCoLC)34670289
040 $aMoKL$cMoKL$dDLC
042 $alccopycat
050 04 $aTS156.2$b.M323 1996
082 00 $a670.42/5$221
245 00 $aMachine vision applications in industrial inspection IV :$b31 January-1 February, 1996, San Jose, California /$cA. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$cc1996.
300 $avii, 284 p. :$bill. ;$c28 cm.
490 1 $aProceedings / SPIE--the International Society for Optical Engineering ;$vv. 2665
504 $aIncludes bibliographic references and author index.
650 0 $aEngineering inspection$xAutomation$xCongresses.
650 0 $aComputer vision$xIndustrial applications$xCongresses.
650 0 $aQuality control$xOptical methods$xAutomation$xCongresses.
700 2 $aRavishankar Rao, A.
700 1 $aChang, Ning-San.
710 2 $aIS & T--the Society for Imaging Science and Technology.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 2665.