| Record ID | marc_loc_2016/BooksAll.2016.part25.utf8:102051060:1018 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part25.utf8:102051060:1018?format=raw |
LEADER: 01018cam a2200277 a 4500
001 96036820
003 DLC
005 20040609180251.0
008 960930s1996 waua b 001 0 eng
010 $a 96036820
020 $a0819423769 (alk. paper)
040 $aDLC$cDLC$dDLC
050 00 $aTA1555$b.S43 1996
082 00 $a621.36/75$221
245 00 $aSelected papers on electronic speckle pattern interferometry :$bprinciples and practice /$ceditors, Peter Meinlschmidt, Klaus D. Hinsch, Rajpal S. Sirohi.
246 30 $aElectronic speckle pattern interferometry
260 $aBellingham, Wash., USA :$bSPIE Optical Engineering Press,$cc1996.
300 $axix, 524 p. :$bill. ;$c29 cm.
440 0 $aSPIE milestone series ;$vv. MS 132
504 $aIncludes bibliographical references and indexes.
650 0 $aHolographic interferometry.
650 0 $aSpeckle.
650 0 $aNondestructive testing.
700 1 $aMeinlschmidt, Peter,$d1960-
700 1 $aHinsch, K. D.$q(Klaus D.),$d1941-
700 1 $aSirohi, R. S.