| Record ID | marc_loc_2016/BooksAll.2016.part25.utf8:89075043:936 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part25.utf8:89075043:936?format=raw |
LEADER: 00936pam a2200241 a 4500
001 96021458
003 DLC
005 20030910210043.0
008 960425s1997 enka b 001 0 eng
010 $a 96021458
020 $a0471949884 (cloth : acid-free paper)
020 $a0471968749 (pbk. : acid-free paper)
040 $aDLC$cDLC$dDLC
050 00 $aQA276$b.T486 1997
082 00 $a300/.72$220
100 1 $aThiessen, Heiner.
245 10 $aMeasuring the real world :$ba textbook in applied statistical methods /$cHeiner Thiessen.
260 $aChichester ;$aNew York :$bJohn Wiley & Sons,$c1997.
300 $axxvii, 268 p. :$bill. ;$c25 cm.
504 $aIncludes bibliographical references (p. [260]-262) and index.
650 0 $aMathematical statistics.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/wiley033/96021458.html
856 4 $3Table of Contents$uhttp://www.loc.gov/catdir/toc/onix04/96021458.html