| Record ID | marc_loc_2016/BooksAll.2016.part26.utf8:92268703:832 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part26.utf8:92268703:832?format=raw |
LEADER: 00832cam a2200253 a 4500
001 97104998
003 DLC
005 20020815201819.0
008 961010s1996 nyua b 001 0 eng d
010 $a 97104998
020 $a007057278X
035 $a(OCoLC)35711081
040 $aWU$cWU$dDLC
042 $alccopycat
050 04 $aTK7874$b.S453 1996
082 00 $a621.3815$221
100 1 $aShepherd, Peter$q(Peter R.)
245 10 $aIntegrated circuit design, fabrication, and test /$cPeter Shepherd.
260 $aNew York :$bMcGraw-Hill,$cc1996.
300 $axv, 223 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aIntegrated circuits$xComputer-aided design.
650 0 $aIntegrated circuits$xTesting.
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/mh022/97104998.html