| Record ID | marc_loc_2016/BooksAll.2016.part27.utf8:12191837:785 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part27.utf8:12191837:785?format=raw |
LEADER: 00785cam a2200229 a 4500
001 98016716
003 DLC
005 20060728220949.0
008 980316s1998 nyua b 001 0 eng
010 $a 98016716
020 $a0824794273 (alk. paper)
040 $aDLC$cDLC$dDLC
050 00 $aTA169.6$b.G47 1998
082 00 $a620/.004$221
100 1 $aGertler, Janos.
245 10 $aFault detection and diagnosis in engineering systems /$cJanos J. Gertler.
260 $aNew York :$bMarcel Dekker,$cc1998.
300 $axx, 484 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references (p. 465-478) and index.
650 0 $aFault location (Engineering)
650 0 $aSystem analysis.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0647/98016716-d.html