| Record ID | marc_loc_2016/BooksAll.2016.part27.utf8:15342267:888 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part27.utf8:15342267:888?format=raw |
LEADER: 00888cam a2200253 a 4500
001 98020291
003 DLC
005 20040121100244.0
008 980428s1998 ja a b 001 0 eng
010 $a 98020291
020 $a4431702342 (softcover : alk. paper)
040 $aDLC$cDLC$dDLC
041 1 $aeng$hjpn
050 00 $aTA417.23$b.S53 1998
082 00 $a620.1/1299$221
100 1 $aShindō, D.$q(Daisuke),$d1953-
240 10 $aZairyō hyōka no tame no kōbunkai no denshi kenbikyōhō.$lEnglish
245 10 $aHigh-resolution electron microscopy for materials science /$cD. Shindo, K. Hiraga.
260 $aTokyo ;$aNew York ;$bSpringer,$cc1998.
300 $aix, 190 p. :$bill. ;$c27 cm.
504 $aIncludes bibliographical references and index.
650 0 $aMaterials$vMicroscopy.
650 0 $aHigh resolution electron microscopy.
700 1 $aHiraga, K.$q(Kenji),$d1939-