| Record ID | marc_loc_2016/BooksAll.2016.part27.utf8:20541032:901 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part27.utf8:20541032:901?format=raw |
LEADER: 00901cam a2200241 a 4500
001 98026178
003 DLC
005 20080307082505.0
008 980605s1998 gw a b 001 0 eng
010 $a 98026178
020 $a3540639764 (hardcover ; alk. paper)
040 $aDLC$cDLC$dDLC
050 00 $aQH212.S3$bR452 1998
082 00 $a502/.8/25$221
100 1 $aReimer, Ludwig,$d1928-
245 10 $aScanning electron microscopy :$bphysics of image formation and microanalysis /$cLudwig Reimer.
250 $a2nd completely rev. and updated ed.
260 $aBerlin ;$aNew York :$bSpringer,$cc1998.
300 $axiv, 527 p. :$bill. ;$c24 cm.
440 0 $aSpringer series in optical sciences ;$vv. 45
504 $aIncludes bibliographical references and index.
650 0 $aScanning electron microscopy.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0812/98026178-d.html