| Record ID | marc_loc_2016/BooksAll.2016.part27.utf8:54267303:1763 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part27.utf8:54267303:1763?format=raw |
LEADER: 01763cam a22003977a 4500
001 98088539
003 DLC
005 20060821104516.0
008 981006s1999 njua b 101 0 eng d
010 $a 98088539
020 $a0780351878 (siftbound)
020 $a0780351886 (microfiche)
035 $a(CStRLIN)NYCGAPQ6628-B
035 $a(NNC)notisAPQ6628
035 $a(OCoLC)ocm42675720
040 $aLHL$cLHL$dDLC
042 $alccopycat
050 00 $aTK7874$b.I47377 1999
082 00 $a621.3815$222
111 2 $aInternational Symposium on the Physical & Failure Analysis of Integrated Circuits$n(7th :$d1999 :$cSingapore)
245 10 $aProceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 :$b5-9 July, 1999, Orchard Hotel, Singapore] /$cedited by Chim Wai Kin, M.K. Radhakrishnan, John Thong ; organised by, IEEE Reliability/CPMT/ED Singapore Chapter ... [et al.].
246 31 $aPhysical & failure analysis of integrated circuites
246 31 $a7th International Symposium on the Physical & Failure Analysis of Integrated Circuits
246 31 $aIPFA '99
260 $aPiscataway, New Jersey :$bIEEE,$cc1999.
300 $a209 p. :$bill. ;$c30 cm.
500 $a"IPFA '99 proceedings"--Cover.
500 $a"IEEE Catalog Number 99TH8394"--verso of T.p.
504 $aIncludes bibliographic references and author index.
650 0 $aIntegrated circuits$xDefects$vCongresses.
650 0 $aIntegrated circuits$xTesting$vCongresses.
700 1 $aChim, Wai Kin.
700 1 $aRadhakrishnan, M. K.
700 1 $aThong, John T. L.
710 2 $aIEEE Reliability/CPMT/ED Singapore Chapter.
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/toc/fy0611/98088539.html