| Record ID | marc_loc_2016/BooksAll.2016.part28.utf8:22697908:1218 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part28.utf8:22697908:1218?format=raw |
LEADER: 01218cam a22003014a 4500
001 99057532
003 DLC
005 20040923073737.0
008 991104s2000 nyua b 001 0 eng
010 $a 99057532
020 $a0471349410 (alk. paper)
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTA169$b.B38 2000
082 00 $a620/.00452$221
100 1 $aRigdon, Steven E.,$d1955-
245 10 $aStatistical methods for the reliability of repairable systems /$cSteven E. Rigdon, Asit P. Basu.
260 $aNew York :$bWiley,$c2000.
300 $axii, 281 p. :$bill. ;$c25 cm.
440 0 $aWiley series in probability and statistics
500 $a"A Wiley-Interscience publication."
504 $aIncludes bibliographical references (p. 267-275) and index.
650 0 $aReliability (Engineering)$xStatistical methods.
650 0 $aMaintainability (Engineering)$xStatistical methods.
700 1 $aBasu, Asit P.
856 42 $3Contributor biographical information$uhttp://www.loc.gov/catdir/bios/wiley043/99057532.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/wiley035/99057532.html
856 4 $3Table of Contents$uhttp://www.loc.gov/catdir/toc/onix06/99057532.html