| Record ID | marc_loc_2016/BooksAll.2016.part28.utf8:238103576:1149 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part28.utf8:238103576:1149?format=raw |
LEADER: 01149cam a22002774a 4500
001 2001091142
003 DLC
005 20080308090344.0
008 010515s2001 nyua b 101 0 eng
010 $a 2001091142
020 $a0735400113
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aQC702.3$b.I6 2000
082 00 $a539.7/3$221
111 2 $aInternational Symposium on Electron Beam Ion Sources and Traps and their Applications$n(8th :$d2000 :$cUpton, N.Y.)
245 10 $aElectron beam ion sources and traps and their applications :$b8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 /$ceditor, Krsto Prelec.
260 $aMelville, N.Y. :$bAmerican Institute of Physics,$c2001.
300 $axiv, 304 p. :$bill. ;$c25 cm.
490 1 $aAIP conference proceedings,$x0094-243X ;$vv. 572
504 $aIncludes bibliographical references and index.
650 0 $aIon sources$vCongresses.
650 0 $aElectron beams$vCongresses.
700 1 $aPrelec, Krsto.
830 0 $aAIP conference proceedings ;$vno. 572.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0817/2001091142-d.html