| Record ID | marc_loc_2016/BooksAll.2016.part29.utf8:10010562:1267 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part29.utf8:10010562:1267?format=raw |
LEADER: 01267cam a22003137a 4500
001 2001273196
003 DLC
005 20130417082004.0
008 010813s2000 waua b 101 0 eng d
010 $a 2001273196
020 $a081943745X (pbk.)
035 $a(OCoLC)ocm45140254
040 $aCUS$cCUS$dDLC
042 $alccopycat
050 00 $aTA418.7$b.S294 2000
082 00 $a620/.44$221
245 00 $aScattering and surface roughness III :$b1-2 August 2000, San Diego, USA /$cZu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$cc2000.
300 $avii, 222 p. :$bill. (some col.) ;$c28 cm.
490 1 $aSPIE proceedings series ;$vv. 4100
500 $a"31 July-2 August 2000"--Cover.
504 $aIncludes bibliographical references and index.
650 0 $aSurface roughness$xMeasurement$vCongresses.
650 0 $aLight$xScattering$vCongresses.
650 0 $aElectromagnetic waves$xScattering$vCongresses.
700 1 $aGu, Zu-Han.
700 1 $aMaradudin, Alexei A.,$d1931-
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 4100.