| Record ID | marc_loc_2016/BooksAll.2016.part29.utf8:214849916:1339 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part29.utf8:214849916:1339?format=raw |
LEADER: 01339cam a22003014a 4500
001 2002102851
003 DLC
005 20080308090855.0
008 020226s2002 nyua b 101 0 eng
010 $a 2002102851
020 $a073540058X
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTK7871.85$b.S773 2001
082 00 $a621.3815/2$222
111 2 $aInternational Workshop on Stress-Induced Phenomena in Metallization$n(6th :$d2001 :$cIthaca, N.Y.)
245 10 $aStress-induced phenomena in metallization :$bSixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001 /$ceditors, Shefford P. Baker ... [et al.].
260 $aMelville, NY :$bAmerican Institute of Physics,$c2002.
300 $aix, 250 p. :$bill. ;$c25 cm.
490 1 $aAIP conference proceedings,$x0094-243X ;$vv. 612
504 $aIncludes bibliographical references and indexes.
650 0 $aIntegrated circuits$xDefects$vCongresses.
650 0 $aThin film devices$xDefects$vCongresses.
650 0 $aElectrodiffusion$xCongresses.
700 1 $aBaker, Shefford P.
830 0 $aAIP conference proceedings ;$vno. 612.
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/fy0604/2002102851.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0817/2002102851-d.html