| Record ID | marc_loc_2016/BooksAll.2016.part29.utf8:233082393:1356 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part29.utf8:233082393:1356?format=raw |
LEADER: 01356cam a2200313 a 4500
001 2002277525
003 DLC
005 20021024180059.0
008 020315s2000 waua b 101 0 eng d
010 $a 2002277525
020 $a0819437786
035 $a(OCoLC)ocm45670019
040 $aLHL$cLHL$dCUS$dDLC
042 $alccopycat
050 00 $aQC443$b.P655 2000
245 00 $aPolarization analysis, measurement, and remote sensing III :$b2-4 August 2000, San Diego, USA /$cDavid B. Chenault ... [et al.], chairs/editors ; sponsored ... by SPIE--The International Society for Optical Engineering ; cooperating organization, the Remote Sensing Society.
260 $aBellingham, Wash. :$bSPIE,$cc2000.
300 $aix, 302 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series,$x0277-786X ;$vv. 4133
500 $aPrevious conferences entitled: Polarization analysis and measurement.
504 $aIncludes bibliographic references and index.
650 0 $aPolarimetry$vCongresses.
650 0 $aRemote sensing$vCongresses.
650 0 $aElectrooptics$vCongresses.
700 1 $aChenault, David B.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
710 2 $aRemote Sensing Society
740 0 $aPolarization analysis and measurement.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 4133.