| Record ID | marc_loc_2016/BooksAll.2016.part29.utf8:5037139:1399 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part29.utf8:5037139:1399?format=raw |
LEADER: 01399cam a2200313 a 4500
001 2001267693
003 DLC
005 20070618153625.0
008 010329s2000 wau 101 0 eng d
010 $a 2001267693
035 $a(OCoLC)ocm43801631
040 $aCUS$cCUS$dDLC
042 $alccopycat
020 $a0819435848
050 00 $aTS156.2$b.M3255 2000
082 00 $a670.42/5$221
245 00 $aMachine vision applications in industrial inspection VIII :$b24-26 January 2000, San Jose, California /$cKenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
260 $aBellingham, Wash., USA :$bSPIE,$cc2000.
300 $aix, 396 p. :$bill. ;$c28 cm.
490 1 $aSPIE proceedings series,$x0277-786X ;$vv. 3966
504 $aIncludes bibliographical references and index.
650 0 $aEngineering inspection$xAutomation$vCongresses.
650 0 $aComputer vision$xIndustrial applications$vCongresses.
650 0 $aQuality control$xOptical methods$xAutomation$vCongresses.
650 0 $aMeasurement$vCongresses.
700 1 $aTobin, Kenneth W.
710 2 $aIS & T--the Society for Imaging Science and Technology.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 3966.