| Record ID | marc_loc_2016/BooksAll.2016.part30.utf8:196829033:1222 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part30.utf8:196829033:1222?format=raw |
LEADER: 01222cam a22003254a 4500
001 2003057604
003 DLC
005 20040610152323.0
008 030724s2004 enka b 001 0 eng
010 $a 2003057604
020 $a047148640X (acid-free paper)
035 $a(DNLM)101186180
040 $aDNLM/DLC$cDLC$dDLC
042 $apcc
050 00 $aQD96.X2$bX28 2004
060 10 $aQD 96.X2$bX87 2004
082 00 $a543/.62$222
245 00 $aX-ray spectrometry :$brecent technological advances /$cedited by Kouichi Tsuji, Jasna Injuk, René Van Grieken.
260 $aChichester, West Sussex, England ;$aHoboken, NJ, USA :$bWiley,$cc2004.
300 $axii, 603 p. :$bill. ;$c26 cm.
504 $aIncludes bibliographical references and index.
650 0 $aX-ray spectroscopy.
650 12 $aChemistry, Analytical.
650 12 $aSpectrometry, X-Ray Emission$xinstrumentation.
650 12 $aSpectrometry, X-Ray Emission$xmethods.
700 1 $aTsuji, Kouichi.
700 1 $aInjuk, Jasna.
700 1 $aGrieken, R. van$q(René)
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/description/wiley0310/2003057604.html
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/wiley032/2003057604.html