| Record ID | marc_loc_2016/BooksAll.2016.part31.utf8:157289985:883 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part31.utf8:157289985:883?format=raw |
LEADER: 00883cam a22002534a 4500
001 2004018169
003 DLC
005 20050502135310.0
008 040803s2005 maua b 001 0 eng
010 $a 2004018169
020 $a1584503467 (pbk. : acid-free paper)
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aQA76.76.T48$bS645 2005
082 00 $a005.1/4$222
245 00 $aSoftware testing techniques :$bfinding the defects that matter /$cScott Loveland ... [et al.].
250 $a1st ed.
260 $aHingham, Mass. :$bCharles River Media,$cc2005.
300 $axxii, 362 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references (p. 335-337) and index.
650 0 $aComputer software$xTesting.
650 0 $aComputer software$xReliability.
700 1 $aLoveland, Scott.
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/ecip0421/2004018169.html