| Record ID | marc_loc_2016/BooksAll.2016.part31.utf8:187464805:1124 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part31.utf8:187464805:1124?format=raw |
LEADER: 01124cam a22003254a 4500
001 2004056966
003 DLC
005 20060728191156.0
008 041020s2005 flua b 001 0 eng
010 $a 2004056966
020 $a1574446827 (alk. paper)
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aQC367$b.M25 2005
082 00 $a681/.25$222
100 1 $aMalacara, Daniel,$d1937-
245 10 $aInterferogram analysis for optical testing /$cDaniel Malacara, Manuel Servín, Zacarias Malacara.
250 $a2nd ed.
260 $aBoca Raton, FL :$bTaylor & Francis,$c2005.
300 $axv, 550 p. :$bill. ;$c24 cm.
490 1 $aOptical engineering ;$v84
504 $aIncludes bibliographical references and index.
650 0 $aOptical measurements.
650 0 $aInterferometry.
650 0 $aInterferometers.
650 0 $aDiffraction patterns$xData processing.
700 1 $aServín, Manuel.
700 1 $aMalacara, Zacarias,$d1948-
830 0 $aOptical engineering (Marcel Dekker, Inc.) ;$vv. 84.
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0648/2004056966-d.html