| Record ID | marc_loc_2016/BooksAll.2016.part31.utf8:204453361:1134 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part31.utf8:204453361:1134?format=raw |
LEADER: 01134cam a22003017a 4500
001 2004114046
003 DLC
005 20080312084625.0
008 040923s2004 gw a b 001 0 eng d
010 $a 2004114046
016 7 $a971871795$2GyFmDB
020 $a3540228225
035 $a(OCoLC)ocm57170628
040 $aOHX$cOHX$dHNK$dDLC
042 $alccopycat
050 00 $aQA76.76.T48$bS83 2004
072 7 $aQA$2lcco
082 00 $a005.14$222
245 00 $aSuccessful test management :$ban integral approach /$cIris Pinkster ... [et al.].
260 $aBerlin :$bSpringer,$cc2004.
300 $axviii, 372 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aComputer software$xTesting.
650 0 $aComputer software$xReliability.
700 1 $aPinkster, Iris,$d1972-
856 42 $3Contributor biographical information$uhttp://www.loc.gov/catdir/enhancements/fy0823/2004114046-b.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0823/2004114046-d.html
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/enhancements/fy0823/2004114046-t.html