| Record ID | marc_loc_2016/BooksAll.2016.part33.utf8:129888609:1283 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part33.utf8:129888609:1283?format=raw |
LEADER: 01283cam a2200325 a 4500
001 2006030741
003 DLC
005 20070822093449.0
008 060915s2007 enka b 001 0 eng
010 $a 2006030741
015 $aGBA685609$2bnb
016 7 $a013572656$2Uk
020 $a9780470016084 (cloth : alk. paper)
020 $a0470016086 (cloth : alk. paper)
035 $a(OCoLC)ocm71507562
035 $a(OCoLC)71507562
040 $aDLC$cDLC$dBAKER$dUKM$dBWKUK$dYDXCP$dBTCTA$dDLC
050 00 $aQC443$b.F85 2007
082 00 $a620.1/1295$222
100 1 $aFujiwara, Hiroyuki.
245 10 $aSpectroscopic ellipsometry :$bprinciples and applications /$cHiroyuki Fujiwara.
260 $aChichester, England ;$aHoboken, NJ :$bJohn Wiley & Sons,$cc2007.
300 $axviii, 369 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aEllipsometry.
650 0 $aSpectrum analysis.
650 0 $aMaterials$xOptical properties.
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/toc/ecip071/2006030741.html
856 42 $3Contributor biographical information$uhttp://www.loc.gov/catdir/enhancements/fy0740/2006030741-b.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0740/2006030741-d.html