| Record ID | marc_loc_2016/BooksAll.2016.part33.utf8:161341550:1212 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part33.utf8:161341550:1212?format=raw |
LEADER: 01212cam a22003137a 4500
001 2006273469
003 DLC
005 20141016075321.0
008 060316s2004 si a b 000 0 eng d
010 $a 2006273469
040 $aSISPL$cSISPL$dUKM$dBAKER$dIXA$dDLC
015 $aGBA485079$2bnb
016 7 $a013036621$2Uk
020 $a9812389407
035 $a(OCoLC)ocm56546079
042 $alccopycat
050 00 $aTK7870.285$b.R33 2004
082 04 $a621.3815$222
245 00 $aRadiation effects and soft errors in integrated circuits and electronic devices /$ceditors, R.D. Schrimpf, D.M. Fleetwood.
260 $aSingapore ;$aNew Jersey :$bWorld Scientific Pub.,$cc2004.
300 $aviii, 339 p. :$bill. ;$c26 cm.
440 0 $aSelected topics in electronics and systems ;$vvol. 34
500 $aAlso published in the International Journal of High Speed Electronics and Systems, v. 14, no. 2 (2004) p. 285-623.
504 $aIncludes bibliographical references.
650 0 $aElectronic circuits$xEffect of radiation on.
650 0 $aIntegrated circuits$xEffect of radiation on.
650 0 $aSoft errors (Computer science)
700 1 $aSchrimpf, Ronald Donald.
700 1 $aFleetwood, D. M.$q(Dan M.)