| Record ID | marc_loc_2016/BooksAll.2016.part33.utf8:81662432:948 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part33.utf8:81662432:948?format=raw |
LEADER: 00948cam a22002657a 4500
001 2005924717
003 DLC
005 20060717090540.0
008 050324s2005 nyua b 001 0 eng d
010 $a 2005924717
040 $aOHX$cOHX$dUAB$dIXA$dDLC
020 $z9780387258000
020 $a0387258000
035 $a(OCoLC)ocm61714990
042 $alccopycat
050 00 $aQH212.E4$bE354 2005
072 7 $aQC$2lcco
100 1 $aEgerton, R. F.
245 10 $aPhysical principles of electron microscopy :$ban introduction to TEM, SEM, and AEM /$cRay F. Egerton.
260 $aNew York, NY :$bSpringer,$cc2005.
300 $axii, 202 p. :$bill. ;$c25 cm.
504 $aIncludes bibliographical references (p. [195]-196) and index.
650 0 $aElectron microscopy.
856 41 $3Table of contents$uhttp://www.loc.gov/catdir/toc/fy0605/2005924717.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0663/2005924717-d.html