| Record ID | marc_loc_2016/BooksAll.2016.part33.utf8:88903417:1105 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part33.utf8:88903417:1105?format=raw |
LEADER: 01105cam a22003017a 4500
001 2005936713
003 DLC
005 20080308092508.0
008 051102s2006 nyua b 001 0 eng d
010 $a 2005936713
020 $a9780387400907
020 $a0387400907
035 $a(CStRLIN)UTBGA3653210-B
035 $a(UPB)a3653210
040 $aUUM$cUUM$dIXA$dOHX$dDLC
042 $alccopycat
050 00 $aQH212.S33$bF68 2006
082 00 $a502.8/2$222
100 1 $aFoster, A.$q(Adam Stuart),$d1975-
245 10 $aScanning probe microscopy :$batomic scale engineering by forces and currents /$cA. Foster, W. Hofer.
260 $aNew York :$bSpringer Science+Business,$cc2006.
300 $axiv, 281 p. :$bill. ;$c25 cm.
440 0 $aNanoscience and technology
504 $aIncludes bibliographical references and index.
650 0 $aScanning probe microscopy.
700 1 $aHofer, Werner,$d1960-
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0817/2005936713-d.html
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/enhancements/fy0817/2005936713-t.html