| Record ID | marc_loc_2016/BooksAll.2016.part34.utf8:141019455:1202 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part34.utf8:141019455:1202?format=raw |
LEADER: 01202cam a2200289 a 4500
001 2007031939
003 DLC
005 20090828084743.0
008 070802s2008 njua 001 0 eng
010 $a 2007031939
020 $a0321503104 (pbk. : alk. paper)
020 $a9780321503107 (pbk. : alk. paper)
035 $a(OCoLC)ocn156831264
035 $a(OCoLC)156831264
040 $aDLC$cDLC$dBTCTA$dBAKER$dYDXCP$dC#P$dDLC
050 00 $aQA76.73.J3$bB49 2008
082 00 $a005.13/3$222
100 1 $aBeust, Cédric.
245 10 $aNext generation Java testing :$bTestNG and advanced concepts /$cCédric Beust, Hani Suleiman.
260 $aUpper Saddle River, NJ :$bAddison-Wesley,$cc2008.
300 $axxiii, 483 p. :$bill. ;$c24 cm.
500 $aIncludes index.
505 0 $aGetting started -- Testing design patterns -- Enterprise testing -- Java EE testing -- Integration -- Extending TestNG -- Digressions -- IDE integration -- TestNG Javadocs -- TestNG.XML-- Migrating from JUnit.
650 0 $aJava (Computer program language)
650 0 $aComputer software$xTesting.
700 1 $aSuleiman, Hani.
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/toc/ecip0724/2007031939.html