| Record ID | marc_loc_2016/BooksAll.2016.part34.utf8:169198213:1353 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part34.utf8:169198213:1353?format=raw |
LEADER: 01353cam a22003737a 4500
001 2007270463
003 DLC
005 20070517083734.0
008 070418s2006 ne a b 000 0 eng d
010 $a 2007270463
015 $aGBA682863$2bnb
016 7 $a013533466$2Uk
020 $a9780387310688 (hbk.)
020 $a0387310681 (hbk.)
020 $a9780387310695 (e-book)
020 $a038731069X (e-book)
035 $a(OCoLC)ocm69105498
040 $aOHX$cOHX$dBAKER$dHNK$dUKM$dYDXCP$dDLC
042 $alccopycat
050 00 $aTK7895.G36$bK37 2006
072 7 $aTK$2lcco
082 04 $a621.381548$222
100 1 $aKastensmidt, Fernanda Lima.
245 10 $aFault-tolerance techniques for SRAM-based FPGAs /$cby Fernanda Lima Kastensmidt, Luigi Carro and Ricardo Reis.
260 $aDordrecht :$bSpringer,$cc2006.
300 $axv, 183 p. :$bill. ;$c25 cm.
440 0 $aFrontiers in electronic testing ;$v32
504 $aIncludes bibliographical references.
650 0 $aField programmable gate arrays.
650 0 $aIntegrated circuits$xFault tolerance.
700 1 $aCarro, Luigi.
700 1 $aReis, Ricardo A. L.$q(Ricardo Augusto da Luz)
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/toc/fy0710/2007270463.html
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0713/2007270463-d.html