| Record ID | marc_loc_2016/BooksAll.2016.part35.utf8:103008785:1196 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part35.utf8:103008785:1196?format=raw |
LEADER: 01196cam a2200325 a 4500
001 2008008799
003 DLC
005 20090901090501.0
008 080228s2009 nyu b 001 0 eng
010 $a 2008008799
020 $a9780415990707 (hb : alk. paper)
020 $a041599070X (hb : alk. paper)
020 $a9780415990714 (pb : alk. paper)
020 $a0415990718 (pb : alk. paper)
020 $a9780203892046 (ebook)
020 $a0203892046 (ebook)
040 $aDLC$cDLC$dDLC
043 $an-us---
050 00 $aLB3051$b.A86 2009
082 00 $a371.26/013$222
100 1 $aAu, Wayne,$d1972-
245 10 $aUnequal by design :$bhigh-stakes testing and the standardization of inequality /$cWayne Au.
260 $aNew York :$aLondon :$bRoutledge,$c2009.
300 $axii, 199 p. ;$c24 cm.
490 0 $aThe critical social thought series
504 $aIncludes bibliographical references (p. 163-189) and index.
650 0 $aEducational tests and measurements$xSocial aspects$zUnited States.
650 0 $aTest bias$zUnited States.
650 0 $aEducational equalization$zUnited States.
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/toc/ecip0812/2008008799.html