| Record ID | marc_loc_2016/BooksAll.2016.part35.utf8:176055228:834 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part35.utf8:176055228:834?format=raw |
LEADER: 00834cam a22002537a 4500
001 2008301306
003 DLC
005 20090514083210.0
008 081211s2008 njua b 001 0 eng d
010 $a 2008301306
020 $a9789812797339
020 $a9812797335
035 $a(OCoLC)ocn213479457
040 $aYDXCP$cYDXCP$dBTCTA$dBAKER$dBWX$dMIA$dAU@$dCUY$dDLC
042 $alccopycat
082 04 $a502.825$222
050 00 $aQH212.E4$bI52 2008
245 00 $aIn-situ electron microscopy at high resolution /$ceditor, Florian Banhart.
260 $aHackensack, NJ :$bWorld Scientific,$cc2008.
300 $avi, 311 p. :$bill. (some col.) ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aElectron microscopy$xTechnique.
650 0 $aHigh resolution electron microscopy.
700 1 $aBanhart, Florian.