| Record ID | marc_loc_2016/BooksAll.2016.part36.utf8:91707922:926 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part36.utf8:91707922:926?format=raw |
LEADER: 00926cam a2200253 a 4500
001 2008941103
003 DLC
005 20110818082719.0
008 081105s2009 nyua b 001 0 eng
010 $a 2008941103
020 $a9780387765006 (hardcover : alk. paper)
040 $aDLC$cDLC$dDLC
050 00 $aTA417.23$b.W56 2009
082 00 $a502/.825$223
100 1 $aWilliams, David B.$q(David Bernard),$d1949-
245 10 $aTransmission electron microscopy :$ba textbook for materials science /$cDavid B. Williams, C. Barry Carter.
250 $a2nd ed.
260 $aNew York :$bSpringer,$c2008.
300 $a4 v. (lxii, 760 p.) :$bill. (some col.) ;$c28 cm.
504 $aIncludes bibliographical references and index.
505 0 $apt. 1. Basics -- pt. 2. Diffraction -- pt. 3. Imaging -- pt. 4. Spectrometry
650 0 $aMaterials$xMicroscopy.
650 0 $aTransmission electron microscopy.
700 1 $aCarter, C. Barry.