| Record ID | marc_loc_2016/BooksAll.2016.part38.utf8:152511846:1023 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part38.utf8:152511846:1023?format=raw |
LEADER: 01023cam a22002897a 4500
001 2010933852
003 DLC
005 20141016075738.0
008 100802s2011 nyua b 001 0 eng d
010 $a 2010933852
020 $a1441969926 (hdbk. : acid-free paper)
020 $a9781441969927 (hdbk. : acid-free paper)
020 $a9781441969934 (e-book)
020 $a1441969934 (e-book)
035 $a(OCoLC)ocn699778302
040 $aNjP$cPUL$dNDD$dVRC$dBTCTA$dYDXCP$dDLC
042 $alccopycat
050 00 $aTK7870$b.S5294 2011
245 00 $aSoft errors in modern electronic systems /$cMichael Nicolaidis, editor.
260 $aNew York :$bSpringer,$cc2011.
300 $axviii, 316 p. :$bill. (some col.) ;$c25 cm.
490 1 $aFrontiers in electronic testing,$x0929-1296 ;$v41
504 $aIncludes bibliographical references and index.
650 0 $aSoft errors (Computer science)
650 0 $aElectronic systems.
700 1 $aNicolaidis, Michael.
830 0 $aFrontiers in electronic testing ;$v41.$x0929-1296