| Record ID | marc_loc_2016/BooksAll.2016.part38.utf8:174719554:935 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part38.utf8:174719554:935?format=raw |
LEADER: 00935cam a22002894a 4500
001 2011012584
003 DLC
005 20120313084305.0
008 110426s2012 nyua b 001 0 eng
010 $a 2011012584
016 7 $a015879904$2Uk
020 $a9781613243268 (hardcover)
020 $a161324326X (hardcover)
035 $a(OCoLC)ocn707608323
040 $aDLC$cDLC$dYDX$dYDXCP$dUKMGB$dOCLCO$dBWX$dDLC
042 $apcc
050 00 $aTA417.25$b.X74 2012
082 00 $a621.36/73$222
245 00 $aX-ray scattering /$cChristopher M. Bauwens, editor.
260 $aNew York :$bNova Science Publishers,$cc2012.
300 $ax, 247 p. :$bill. ;$c26 cm.
490 1 $aMaterials science and technologies
504 $aIncludes bibliographical references and index.
650 0 $aRadiography, Industrial.
650 0 $aX-rays$xScattering.
700 1 $aBauwens, Christopher M.
830 0 $aMaterials science and technologies series.