| Record ID | marc_loc_2016/BooksAll.2016.part38.utf8:306515771:1280 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part38.utf8:306515771:1280?format=raw |
LEADER: 01280cam a22003377a 4500
001 2011377775
003 DLC
005 20110731080911.0
008 110711s2010 waua b 100 0 eng
010 $a 2011377775
020 $a9780819482884
020 $a0819482889
035 $a(OCoLC)ocn700942801
040 $aCAI$cCAI$dDLC
042 $alccopycat
050 00 $aTA418.7$b.R432 2010
082 00 $a620.1/1292$223
245 00 $aReflection, scattering, and diffraction from surfaces II :$b2-4 August 2010, San Diego, California, United States /$cZu-Han Gu, Leonard M. Hanssen, editors ; sponsored ... by SPIE.
260 $aBellingham, Wash. :$bSPIE,$cc2010.
300 $a1 v. (various pagings) :$bill. ;$c28 cm.
490 1 $aProceedings of SPIE,$x0277-786X ;$vv. 7792
504 $aIncludes bibliographical references.
650 0 $aSurface roughness$xMeasurement$vCongresses.
650 0 $aDiffractive scattering$vCongresses.
650 0 $aOptical measurements$vCongresses.
650 0 $aScattering (Physics)$vCongresses.
650 0 $aMetrology$vCongresses.
700 1 $aGu, Zu-Han.
700 1 $aHanssen, Leonard Matheus,$d1953-
710 2 $aSPIE (Society)
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 7792.$x0277-786X