| Record ID | marc_loc_2016/BooksAll.2016.part39.utf8:161019757:1031 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part39.utf8:161019757:1031?format=raw |
LEADER: 01031cam a22003017a 4500
001 2011932173
003 DLC
005 20130424082411.0
008 110615s2011 nyua b 001 0 eng d
010 $a 2011932173
020 $a9781441999450 (alk. paper)
020 $a1441999450 (alk. paper)
020 $a9781441999467 (e-ISBN)
035 $a(OCoLC)ocn731920135
040 $aBTCTA$beng$cBTCTA$dYDXCP$dBWX$dIXA$dCDX$dZ5A$dDLC
042 $alccopycat
050 00 $aT174.7$b.S545 2011
082 04 $a620.5$223
245 00 $aSignal measurement and estimation techniques for micro and nanotechnology /$cCédric Clévy, Micky Rakotondrabe, Nicolas Chaillet, editors.
260 $aNew York :$bSpringer Verlag,$c2011.
300 $ax, 242 p. :$bill. (some col.) ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aNanotechnology.
650 0 $aMicrotechnology.
650 0 $aInformation measurement.
700 1 $aClévy, Cédric.
700 1 $aRakotondrabe, Micky.
700 1 $aChaillet, Nicolas.