| Record ID | marc_loc_2016/BooksAll.2016.part39.utf8:288000505:1201 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part39.utf8:288000505:1201?format=raw |
LEADER: 01201cam a2200301 a 4500
001 2012359075
003 DLC
005 20120303085645.0
008 120128s2011 ohua bf 001 0 eng
010 $a 2012359075
020 $a9781615037254
020 $a161503725X
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTK7871$b.M52 2011
082 00 $a621.381$223
245 00 $aMicroelectronics failure analysis :$bdesk reference /$cedited by Richard J. Ross.
250 $a6th ed.
260 $aMaterials Park, Ohio :$bASM International,$cc2011.
300 $axi, 660 p. :$bill. ;$c28 cm. +$e1 CD-ROM (4 3/4 in.).
500 $aIncludes bibliographical references and index.
538 $aSystem requirements for accompanying CD-ROM: Windows 95/98/NT/ME/2000/XP ; Macintosh 8/9/Classic.
650 0 $aElectronics$xMaterials$xTesting$vHandbooks, manuals, etc.
650 0 $aMicroelectronics$xMaterials$xTesting$vHandbooks, manuals, etc.
650 0 $aMicroelectronics$xMaterials$xDefects$vHandbooks, manuals, etc.
650 0 $aElectronic apparatus and appliances$xTesting$vHandbooks, manuals, etc.
650 0 $aSemiconductors$xDefects$vHandbooks, manuals, etc.
700 1 $aRoss, Richard J.