| Record ID | marc_loc_2016/BooksAll.2016.part40.utf8:189400385:1052 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part40.utf8:189400385:1052?format=raw |
LEADER: 01052cam a22003137a 4500
001 2012949821
003 DLC
005 20130101082744.0
008 120920s2013 gw a b 001 0 eng d
010 $a 2012949821
020 $a9783642297601 (alk. paper)
020 $a3642297609 (alk. paper)
020 $a9783642297618 (ebk.)
035 $a(OCoLC)ocn796932144
040 $aYDXCP$cYDXCP$dBWX$dDCU$dDLC
042 $alccopycat
050 00 $aTA417.23$b.F85 2013
100 1 $aFultz, B.$q(Brent)
245 10 $aTransmission electron microscopy and diffractometry of materials /$cBrent Fultz, James Howe.
250 $a4th ed.
260 $aHeidelberg ;$aNew York :$bSpringer,$cc2013.
300 $axx, 761 p. :$bill. ;$c24 cm.
490 1 $aGraduate texts in physics,$x1868-4513
504 $aIncludes bibliographical references 9P. 736-745) and index.
650 0 $aMaterials$xMicroscopy.
650 0 $aTransmission electron microscopy.
650 0 $aX-ray diffractometer.
700 1 $aHowe, James M.,$d1955-
830 0 $aGraduate texts in physics.