| Record ID | marc_loc_2016/BooksAll.2016.part40.utf8:191260376:1458 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part40.utf8:191260376:1458?format=raw |
LEADER: 01458cam a22003617i 4500
001 2012952142
003 DLC
005 20150513082705.0
008 121019t20132013au a b 001 0 eng d
010 $a 2012952142
020 $a9783211993552 (alk. paper)
020 $a321199355X (alk. paper)
020 $z9783211993569 (ebk.)
035 $a(OCoLC)ocn840900154
040 $aIYU$beng$cIYU$erda$dOCLCQ$dOCLCA$dOCLCO$dOCLCF$dDLC
042 $alccopycat
050 00 $aQD131$b.S36 2013
082 00 $a620.1/127$223
100 1 $aSchmidt, Bernd,$eauthor.
245 10 $aIon beams in materials processing and analysis /$cBernd Schmidt, Klaus Wetzig.
264 1 $aWien ;$aNew York :$bSpringer,$c[2013]
264 4 $c©2013
300 $aix, 418 pages :$billustrations (some color) ;$c24 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
338 $avolume$bnc$2rdacarrier
504 $aIncludes bibliographical references and index.
505 0 $aIon-solid interactions -- Ion beam technology -- Materials processing -- Ion beam preparation of materials -- Materials analysis by ion beams -- Special ion beam applications in materials analysis problems.
650 0 $aMaterials$xAnalysis.
650 0 $aIon bombardment$xIndustrial applications.
650 7 $aIon bombardment$xIndustrial applications.$2fast$0(OCoLC)fst00978570
650 7 $aMaterials$xAnalysis.$2fast$0(OCoLC)fst01011773
700 1 $aWetzig, Klaus,$eauthor.