| Record ID | marc_loc_2016/BooksAll.2016.part40.utf8:46443180:1074 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_2016/BooksAll.2016.part40.utf8:46443180:1074?format=raw |
LEADER: 01074cam a22002897a 4500
001 2012419822
003 DLC
005 20121203120239.0
008 121025s2010 sz a b 001 0 eng d
010 $a 2012419822
015 $aGBB120845$2bnb
016 7 $a015750295$2Uk
020 $a9783037850435 (pbk.)
020 $a3037850434 (pbk.)
035 $a(OCoLC)ocn751516018
040 $aUKMGB$cUKMGB$dUAB$dVRC$dBTCTA$dYDXCP$dDLC
042 $alccopycat
050 00 $aQC611.6.D4$bD44 2010
082 04 $a621.38152$222
245 00 $aDefects and diffusion, theory and simulation :$ban annual retrospective II /$ceditor, D.J. Fisher.
260 $aStafa-Zurich :$bTrans Tech Publications ;$aEnfield, NH :$bDistributed in the Americas by Trans Tech Publications,$cc2010.
300 $avi, 215 p. :$bill. ;$c25 cm.
490 0 $aDiffusion and defect data. Part A, Diffusion and defect forum,$x1012-0386 ;$vv. 307
504 $aIncludes bibliographical references and indexes.
650 0 $aSemiconductors$xDefects.
650 0 $aSemiconductors$xDiffusion.
700 1 $aFisher, D. J.