MARC Record from Library of Congress

LEADER: 02210cam a22003617i 4500
001 2015297036
003 DLC
005 20150613090625.0
008 150509s2015 flua b 001 0 eng d
010 $a 2015297036
020 $z9781466590830
035 $a(OCoLC)ocn907680950
040 $aFTU$cFTU$erda$dDLC
042 $alccopycat
050 00 $aQC912.3$b.A94 2015
100 1 $aAutran, Jean-Luc,$d1969-$eauthor.
245 10 $aSoft errors :$bfrom particles to circuits /$cJean-Luc Autran, Daniela Munteanu.
264 1 $aBoca Raton, Florida :$bCRC Press,$c[2015]
300 $axlii, 397 pages :$billustrations ;$c26 cm
336 $atext$btxt$2rdacontent
337 $aunmediated$bn$2rdamedia
338 $avolume$bnc$2rdacarrier
490 1 $aDevices, circuits, and systems
504 $aIncludes bibliographical reference and index.
520 $aThis book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits.
505 0 $aChapter 1: Terrestrial cosmic rays and atmospheric radiation background -- Chapter 2: Detection and characterization of atmospheric neutrons at terrestrial level: neutron monitors -- Chapter 3: Natural radioactivity of electronic materials -- Chapter 4: Alpha-radiation metrology in electronic materials -- Chapter 5: Particle interactions with matter and mechanisms of soft errors in semiconductor circuits -- Chapter 6: Accelerated tests -- Chapter 7: Real-time (life) testing
505 8 $aChapter 8: Modeling and simulation of single-event effects in devices and circuits -- Chapter 9: Soft-error rate (SER) Monte Carlo simulation codes -- Chapter 10: Scaling effects and their implications for soft errors -- Chapter 11: Natural radiation in nonvolatile memories: a case study -- Chapter 12: SOI, FinFET, and emerging devices.
650 0 $aSoft errors (Computer science)
650 0 $aAtmospheric radiation.
650 0 $aCosmic rays.
650 0 $aParticles.
700 1 $aMunteanu, Daniela,$eauthor.
830 0 $aDevices, circuits, and systems.