| Record ID | marc_loc_updates/v35.i10.records.utf8:12265368:983 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v35.i10.records.utf8:12265368:983?format=raw |
LEADER: 00983nam a22003014a 4500
001 2006935051
003 DLC
005 20070228183202.0
008 060920s2007 gw a b 001 0 eng c
010 $a 2006935051
015 $aGBA692902$2bnb
016 7 $a013590687$2Uk
020 $a3540484884
020 $a9783540484882
035 $a(OCoLC)ocm74969535
040 $aUKM$cUKM$dBAKER$dOHX$dDAY$dIQU$dDLC
042 $apcc
050 00 $aQC176.8.E35$bW576 2007
050 14 $aQC1$b.S797 vol. 223
100 1 $aWissmann, P.$q(Peter),$d1936-
245 10 $aElectrical resistivity of thin metal films /$cPeter Wi€mann, Hans-Ulrich Finzel.
260 $aBerlin ;$aNew York :$bSpringer,$cc2007.
300 $avi, 126 p. :$bill. ; 24 cm.
440 0 $aSpringer tracts in modern physics ;$v223
504 $aIncludes bibliographical references and index.
650 0 $aMetallic films$xElectric properties.
650 0 $aElectric resistance$xMeasurement.
700 1 $aFinzel, Hans-Ulrich.