| Record ID | marc_loc_updates/v35.i13.records.utf8:26661437:1047 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v35.i13.records.utf8:26661437:1047?format=raw |
LEADER: 01047cam a22003017a 4500
001 2007270894
003 DLC
005 20070320124405.0
008 070111s2006 ne a b 001 0 eng d
010 $a 2007270894
016 7 $a97982642X$2GyFmDB
020 $a0387314180 (hd. bd.)
020 $a9780387314181 (hd. bd.)
024 3 $a9780387314181
035 $a(OCoLC)ocm70840961
035 $a(OCoLC)70840961
040 $aOHX$cOHX$dBAKER$dYDXCP$dOCLCQ$dHKP$dUKM$dUAB$dDLC
042 $alccopycat
050 00 $aTK7878$b.M335 2006
072 7 $aTK$2lcco
100 1 $aMaichen, Wolfgang.
245 10 $aDigital timing measurements :$bfrom scopes and probes to timing and jitter /$cby Wolfgang Maichen.
260 $aDordrecht :$bSpringer,$cc2006.
300 $axiii, 240 p. :$bill. ;$c25 cm.
440 0 $aFrontiers in electronic testing ;$v33.
504 $aIncludes bibliographical references (p. 223-228) and index.
650 0 $aElectronic measurements.
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/toc/fy0707/2007270894.html