| Record ID | marc_loc_updates/v35.i21.records.utf8:18995202:1704 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v35.i21.records.utf8:18995202:1704?format=raw |
LEADER: 01704cam a22003857a 4500
001 2006921186
003 DLC
005 20070515180520.0
008 060125s2006 gw a b 101 0 eng d
010 $a 2006921186
040 $aYUS$cYUS$dOHX$dCUS$dC$Q$dVRC$dDLC
020 $a3540326049
024 3 $a9783540326045
035 $a(OCoLC)ocm68439376
042 $alccopycat
050 00 $aQA76.76.V47$bI54 2005
082 00 $a005.1/4$222
111 2 $aInternational Haifa Verification Conference$n(1st :$d2005 :$cHaifa, Israel)
245 10 $aHardware and software, verification and testing :$bFirst International Haifa Verification Conference, Haifa, Israel, November 13-16, 2005 : revised selected papers /$cShmuel Ur, Eyal Bin, Yaron Wolfsthal (eds.).
246 30 $aFirst International Haifa Verification Conference
246 30 $aInternational Haifa Verification Conference
260 $aBerlin ;$aNew York :$bSpringer,$c2006.
300 $ax, 264 p. :$bill. ;$c24 cm.
440 0 $aLecture notes in computer science,$x0302-9743 ;$v3875
504 $aIncludes bibliographical references and index.
530 $aAlso issued online.
650 0 $aComputer systems$xVerification$vCongresses.
650 0 $aComputer software$xVerification$vCongresses.
650 0 $aComputer programs$xVerification$vCongresses.
650 0 $aIntegrated circuits$xVerification$vCongresses.
700 1 $aUr, Shmuel.
700 1 $aBin, Eyal.
700 1 $aWolfsthal, Yaron.
856 41 $uhttp://springerlink.metapress.com/openurl.asp?genre=issue&issn=0302-9743&volume=3875$zRestricted to SpringerLink subscribers
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0661/2006921186-d.html