MARC Record from Library of Congress

LEADER: 02039cam a2200409 a 4500
001 2004296369
003 DLC
005 20070615182131.0
008 040127s2003 waua b 101 0 eng d
010 $a 2004296369
020 $a0819448702
035 $a(OCoLC)ocm52054598
040 $aLHL$cLHL$dDLC
042 $alccopycat
050 00 $aQC367$b.L54 2003
245 00 $aLightmetry 2002 :$bmetrology and testing techniques using light : 14-16 May, 2002, Warsaw, Poland /$cMaksymilian Pluta, Mariusz Szyjer, chairs/editors ; Ewa Powichrowska, co-editor ; organized by SPIE Poland Chapter [and] Institute of Applied Optics (Poland) ; sponsored by SPIE--the International Society for Optical Engineering [and] State Committee for Scientific Research (Poland) ; published by Spie--the International Society for Optical Engineering.
246 30 $aMetrology and testing techniques using light
260 $aBellingham, Wash. :$bSPIE,$cc2003.
300 $axx, 338 p. :$bill. ;$c28 cm.
440 0 $aSPIE Poland Chapter proceedings ;$v68
490 1 $aSPIE proceedings series,$x0277-786X ;$vv. 5064
500 $aPrevious conference entitled: Lightmetry : metrology, spectroscopy, and testing techniques using light.
504 $aIncludes bibliographical references and author index.
650 0 $aLight$vCongresses.
650 0 $aPolarization (Light)$vCongresses.
650 0 $aOptical measurements$vCongresses.
650 0 $aOptical detectors$vCongresses.
650 0 $aMeasurement$vCongresses.
700 1 $aPluta, Maksymilian.
700 1 $aSzyjer, Mariusz.
700 1 $aPowichrowska, Ewa.
710 2 $aSociety of Photo-optical Instrumentation Engineers.
710 2 $aSociety of Photo-optical Instrumentation Engineers.$bPoland Chapter.
710 2 $aInstitute of Applied Optics (Poland)
710 2 $aKomitet Badań Naukowych (Poland)
730 0 $aLightmetry : metrology, spectroscopy, and testing techniques using light.
830 0 $aProceedings of SPIE--the International Society for Optical Engineering ;$vv. 5064.