| Record ID | marc_loc_updates/v36.i10.records.utf8:16541379:1041 |
| Source | Library of Congress |
| Download Link | /show-records/marc_loc_updates/v36.i10.records.utf8:16541379:1041?format=raw |
LEADER: 01041cam a22002894a 4500
001 2002070720
003 DLC
005 20080306081857.0
008 020529s2002 gw a b 001 0 eng
010 $a 2002070720
020 $a3540437649 (alk. paper)
040 $aDLC$cDLC$dDLC
042 $apcc
050 00 $aTA417.23$b.F85 2002
082 00 $a620.1/1299$221
100 1 $aFultz, B.$q(Brent)
245 10 $aTransmission electron microscopy and diffractometry of materials /$cBrent Fultz, James Howe.
250 $a2nd ed.
260 $aBerlin ;$aNew York :$bSpringer,$cc2002.
300 $axxi, 748 p. :$bill. ;$c24 cm.
504 $aIncludes bibliographical references and index.
650 0 $aMaterials$xMicroscopy.
650 0 $aTransmission electron microscopy.
650 0 $aX-ray diffractometer.
700 1 $aHowe, James M.,$d1955-
856 42 $3Publisher description$uhttp://www.loc.gov/catdir/enhancements/fy0812/2002070720-d.html
856 41 $3Table of contents only$uhttp://www.loc.gov/catdir/enhancements/fy0812/2002070720-t.html